MTV 2007 Eighth International Workshop on Microprocessor Test and Verification : proceedings, 5-6 December, 2007, Austin. Texas, USA / sponsored by IEEE Computer Society Test Technology Technical Council (TTTC) ... [et al.].
| Author/creator | International Workshop on Microprocessor Test and Verification |
| Other author | IEEE Computer Society. Technical Council on Test Technology. |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Los Alamitos, Calif. : IEEE Computer Society, |
| Description | x, 137 p. : ill. ; 28 cm. |
| Supplemental Content | Full text available from IEEE Conference Proceedings Archive 2005-2009 |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Subjects |
| Portion of title | Eighth International Workshop on Microprocessor Test and Verification |
| Portion of title | Microprocessor Test and Verification |
| General note | "IEEE Computer Society Order Number P3241"--T.p. verso. |
| General note | "Common Challenges and Solutions" -- cover. |
| Bibliography note | Includes bibliographical references and author index. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 2009278610 |
| ISBN | 9780769532417 |
| ISBN | 0769532411 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |