International Test Conference, 1991 proceedings.
| Author/creator | International Test Conference |
| Other author | Institute of Electrical and Electronics Engineers. |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Altoona, PA : The Conference, |
| Description | xiv, 1135 p. : ill. ; 30 cm. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Conference Proceedings Archive |
| Subjects |
| General note | "1991 IEEE International Test Conference"--Cover. |
| General note | Twenty-second meeting held in Nashville, Tenn. |
| General note | "IEEE catalog number 91CH3032-0"--T. p. verso. |
| Bibliography note | Includes bibliographical references and index. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| Other title | 1991 IEEE International Test Conference. |
| Other title | IEEE International Test Conference. |
| LCCN | 91055309 |
| ISBN | 0818691565 |
| ISBN | 0780302427 (lib. bdg.) |
| ISBN | 0818661569 (microfiche) |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |