IEEE Symposium on Visual Analytics Science and Technology, 2008 proceedings, Columbus, Ohio, USA, October 21-October 23, 2008 / edited by David Ebert, Thomas Ertl.
| Author/creator | IEEE Symposium on Visual Analytics Science and Technology |
| Format | Electronic |
| Publication Info | Piscataway, N.J. : IEEE, |
| Description | xi, 222 p. : ill. (some col.), maps ; 28 cm. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Conference Proceedings Archive 2005-2009 |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Subjects |
| Other author/creator | Ebert, David. |
| Other author/creator | Ertl, Thomas, 1957- |
| Other author/creator | IEEE Computer Society. Technical Committee on Visualization and Graphics. |
| Other author/creator | SIGGRAPH. |
| Other author/creator | IEEE Xplore (Online service) |
| General note | "Held co-jointly with VisWeek 2008, October 19-24." |
| General note | "Sponsored by IEEE Computer Society Visualization and Graphics Technical Committee in cooperation with ACM SIGGRAPH." |
| General note | "VAST08"--Cover. |
| Bibliography note | Includes bibliographical references and index. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 2009417579 |
| ISBN | 9781424429356 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |