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010 a| 00712267;

020 a| 0780352645 (softbound edition);

020 a| 0780352653 (casebound edition);

020 a| 0780352661 (microfiche edition);

035 a| (WaSeSS)ssj0000454842;

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049 a| EREEa| NEHH;

050 00 a| TK7871.85b| .I27 1999;

082 00 a| 621.3815/22| 21;

111 2 a| IEEE Semiconductor Thermal Measurement and Management Symposiumn| (15th :d| 1999 :c| San Diego, California)?| UNAUTHORIZED;

245 10 a| Fifteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposiumh| [electronic resource] :b| San Diego, CA, USA, March 9-11, 1999 /c| sponsored by: IEEE Components, Packaging, and Manufacturing Technology Society.;

246 31 a| Semiconductor Thermal Measurement and Management Symposium;

260 a| Piscataway, New Jersey :b| IEEE,;

300 a| xvi, 299 p. :b| ill. ;c| 28 cm.;

500 a| Cover title.;

500 a| "IEEE Catalog Number 99CH36306"--Cover.;

504 a| Includes bibliographic references.;

506 a| Available only to authorized users.;

538 a| Mode of access: World Wide Web;

650 0 a| Semiconductorsx| Thermal propertiesv| Congresses.=| ^A214372;

650 0 a| Semiconductorsx| Coolingv| Congresses.=| ^A906354;

655 0 a| Electronic books.=| ^A491897;

710 2 a| IEEE Components, Hybrids, and Manufacturing Technology Society.=| ^A723462;

710 2 a| IEEE Xplore (Online service)=| ^A534875;

856 40 z| Full text available from IEEE Electronic Library (IEL) Conference Proceedingsu| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D6173;

856 40 z| Full text available from IEEE Conference Proceedings Archiveu| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D6173;

856 40 z| Full text available from IEEE Electronic Library (IEL)u| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D6173;

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Fifteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium San Diego, CA, USA, March 9-11, 1999 / sponsored by: IEEE Components, Packaging, and Manufacturing Technology Society.

Author/creator	IEEE Semiconductor Thermal Measurement and Management Symposium
Other author	IEEE Components, Hybrids, and Manufacturing Technology Society.
Other author	IEEE Xplore (Online service)
Format	Electronic
Publication Info	Piscataway, New Jersey : IEEE,
Description	xvi, 299 p. : ill. ; 28 cm.
Supplemental Content	Full text available from IEEE Electronic Library (IEL) Conference Proceedings
Supplemental Content	Full text available from IEEE Conference Proceedings Archive
Supplemental Content	Full text available from IEEE Electronic Library (IEL)
Subjects	Semiconductors--Thermal properties. --Congresses. Semiconductors--Cooling. --Congresses.

Parallel title	Semiconductor Thermal Measurement and Management Symposium
General note	Cover title.
General note	"IEEE Catalog Number 99CH36306"--Cover.
Bibliography note	Includes bibliographic references.
Access restriction	Available only to authorized users.
Technical details	Mode of access: World Wide Web
Genre/form	Electronic books.
LCCN	00712267
ISBN	0780352645 (softbound edition)
ISBN	0780352653 (casebound edition)
ISBN	0780352661 (microfiche edition)

Availability

Library	Location	Call Number	Status	Item Actions
	Electronic Resources	Online Content Full text available from IEEE Electronic Library (IEL) Conference Proceedings Full text available from IEEE Electronic Library (IEL) Conference Proceedings Full text available from IEEE Electronic Library (IEL) Conference Proceedings	✔ Available

Fifteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium San Diego, CA, USA, March 9-11, 1999 / sponsored by: IEEE Components, Packaging, and Manufacturing Technology Society.

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