DFT 2007 22nd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 26-28 September, 2007, Rome, Italy / edited by Cristiana Bolchini ... [et al.] ; IEEE Computer Society.
| Author/creator | IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems |
| Other author | Bolchini, Cristiana. |
| Other author | IEEE Computer Society. |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Los Alamitos, Calif. : IEEE Computer Society Press, |
| Description | xivi, 537 p. : ill. ; 23 cm. |
| Supplemental Content | Full text available from IEEE Conference Proceedings Archive 2005-2009 |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Subjects |
| Portion of title | International Symposium on Defect and Fault Tolerance in VLSI Systems |
| Portion of title | Defect and fault tolerance in VLSI systems |
| General note | "IEEE Computer Society Order Number P2885"--T.p. verso. |
| Bibliography note | Includes bibliographical references and author index. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 2007931917 |
| ISBN | 0769528856 |
| ISBN | 9780769528854 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |