Tools

LEADER 02497cam a22004814a 4500

001 ssj0000367998;

003 WaSeSS;

005 20230612080446.0;

006 m d ;

007 cr n ;

008 001129s2000 nyua sb 101 0 eng d;

010 a| 00111547;

020 a| 156396967X;

035 a| (WaSeSS)ssj0000367998;

040 a| DLCc| DLCd| DLCd| WaSeSS;

042 a| pcc;

049 a| EREEa| NEHH;

050 00 a| TK7874.76b| .C495 2000;

082 00 a| 621.39/52| 22;

245 00 a| Characterization and metrology for ULSI technology 2000h| [electronic resource]:b| International Conference,Gaithersburg, Maryland, 26-29, June 2000 /c| editors David G. Seiler ... [et al.].;

260 a| Melville, N.Y. :b| American Institute of Physics,;

300 a| 2 v. :b| ill. ;c| 28 cm. +e| 1 CD-ROM (4 3/4 in.);

490 1 a| AIP Conference Proceedings ;v| vol. 550;

500 a| "The 2000 International Conference on Characterization and Metrology for ULSI Technology was held at the National Institute of Standards and Technology from June 26 to June 29, 2000"--Pref.;

500 a| Accompanying computer disc contains full text from the book.;

504 a| Includes bibliographical references and index.;

506 a| Available only to authorized users.;

538 a| Mode of access: World Wide Web;

650 0 a| Integrated circuitsx| Ultra large scale integrationv| Congresses.=| ^A906457;

655 0 a| Electronic books.=| ^A491897;

700 1 a| Seiler, David G.=| ^A434234;

711 2 a| International Conference on Characterization and Metrology for ULSI Technologyd| (1998 :c| Gaithersburg, Md.)?| UNAUTHORIZED;

830 0 a| AIP conference proceedings ;v| no. 550.=| ^A24766;

856 40 z| Full text available from AIP Conference Proceedingsu| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fpubs.aip.org%2Faip%2Facp%2Fissue%2F550%2F1;

949 a| CLICK ON WEB ADDRESSw| ASISh| JOYNER188;

949 a| CLICK ON WEB ADDRESSw| ASISh| HSL77;

949 a| CLICK ON WEB ADDRESSw| ASISh| JMUSIC60;

596 a| 1 3 4;

998 a| 4009644;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 4009644-1001l| JNETm| JOYNERr| Ys| Yt| JNESSBKu| 1/1/2016x| EBOOKz| JERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 4009644-2001l| HSLELECm| HSLr| Ys| Yt| HEBKu| 1/1/2016x| EBOOKz| HERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 4009644-3001l| MNETm| JMUSICr| Ys| Yt| MNESSBKu| 1/1/2016x| EBOOKz| JERESOURCE;

Characterization and metrology for ULSI technology 2000 International Conference,Gaithersburg, Maryland, 26-29, June 2000 / editors David G. Seiler ... [et al.].

Other author	Seiler, David G.
Other author	International Conference on Characterization and Metrology for ULSI Technology (1998 : Gaithersburg, Md.)
Format	Electronic
Publication Info	Melville, N.Y. : American Institute of Physics,
Description	2 v. : ill. ; 28 cm. + 1 CD-ROM (4 3/4 in.)
Supplemental Content	Full text available from AIP Conference Proceedings
Subjects	Integrated circuits--Ultra large scale integration. --Congresses. Integrated circuits--Ultra large scale integration. --Congresses. --Software.

Series	AIP Conference Proceedings ; vol. 550 AIP conference proceedings ; no. 550. ^A24766
General note	"The 2000 International Conference on Characterization and Metrology for ULSI Technology was held at the National Institute of Standards and Technology from June 26 to June 29, 2000"--Pref.
General note	Accompanying computer disc contains full text from the book.
Bibliography note	Includes bibliographical references and index.
Access restriction	Available only to authorized users.
Technical details	Mode of access: World Wide Web
Genre/form	Electronic books.
LCCN	00111547
ISBN	156396967X

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Characterization and metrology for ULSI technology 2000 International Conference,Gaithersburg, Maryland, 26-29, June 2000 / editors David G. Seiler ... [et al.].

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