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020 a| 0780356497 (softbound);

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050 00 a| TK7874b| .I4735 1999;

082 00 a| 621.38152| 21;

111 2 a| International Integrated Reliability Workshopd| (1999 :c| Lake Tahoe, Calif.)?| UNAUTHORIZED;

245 10 a| 1999 IEEE International Integrated Reliability Workshop final reporth| [electronic resource] :b| Stanford Sierra Camp, Lake Tahoe, California, October 18-21, 1998 /c| sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.;

260 a| Piscataway, NJ :b| IEEE Electron Devices Society :b| IEEE Reliability Society,;

300 a| viii, 188 p. :b| ill. ;c| 28 cm.;

500 a| "IEEE Catalog No. 98TH8460.";

504 a| Includes bibliographical references.;

506 a| Available only to authorized users.;

538 a| Mode of access: World Wide Web;

650 0 a| Integrated circuitsx| Reliabilityv| Congresses.=| ^A725830;

655 0 a| Electronic books.=| ^A491897;

710 2 a| IEEE Electron Devices Society.=| ^A85580;

710 2 a| IEEE Reliability Society.=| ^A725831;

710 2 a| IEEE Xplore (Online service)=| ^A534875;

856 40 z| Full text available from IEEE Electronic Library (IEL)u| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D6735;

856 40 z| Full text available from IEEE Electronic Library (IEL) Conference Proceedingsu| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D6735;

856 40 z| Full text available from IEEE Conference Proceedings Archiveu| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D6735;

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999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 3948961-3001l| MNETm| JMUSICr| Ys| Yt| MNESSBKu| 1/1/2016x| EBOOKz| JERESOURCE;

1999 IEEE International Integrated Reliability Workshop final report Stanford Sierra Camp, Lake Tahoe, California, October 18-21, 1998 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.

Author/creator	International Integrated Reliability Workshop
Other author	IEEE Electron Devices Society.
Other author	IEEE Reliability Society.
Other author	IEEE Xplore (Online service)
Format	Electronic
Publication Info	Piscataway, NJ : IEEE Electron Devices Society : IEEE Reliability Society,
Description	viii, 188 p. : ill. ; 28 cm.
Supplemental Content	Full text available from IEEE Electronic Library (IEL)
Supplemental Content	Full text available from IEEE Electronic Library (IEL) Conference Proceedings
Supplemental Content	Full text available from IEEE Conference Proceedings Archive
Subjects	Integrated circuits--Reliability. --Congresses. Integrated circuits--Wafer-scale integration. --Reliability. --Congresses.

General note	"IEEE Catalog No. 98TH8460."
Bibliography note	Includes bibliographical references.
Access restriction	Available only to authorized users.
Technical details	Mode of access: World Wide Web
Genre/form	Electronic books.
LCCN	99062857
ISBN	0780356497 (softbound)

Availability

Library	Location	Call Number	Status	Item Actions
	Electronic Resources	Online Content Full text available from IEEE Electronic Library (IEL) Full text available from IEEE Electronic Library (IEL) Full text available from IEEE Electronic Library (IEL)	✔ Available

1999 IEEE International Integrated Reliability Workshop final report Stanford Sierra Camp, Lake Tahoe, California, October 18-21, 1998 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.

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