1998 IEEE International Integrated Reliability Workshop final report Stanford Sierra Camp, Lake Tahoe, California, October 12-15, 1998 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.

Author/creator International Integrated Reliability Workshop
Other author IEEE Electron Devices Society.
Other author IEEE Reliability Society.
Other author IEEE Xplore (Online service)
Format Electronic
Publication InfoPiscataway, New Jersey : IEEE Electron Devices Society : IEEE Reliability Society,
Descriptionvi, 140 p. : ill. ; 28 cm.
Supplemental ContentFull text available from IEEE Electronic Library (IEL)
Supplemental ContentFull text available from IEEE Conference Proceedings Archive
Supplemental ContentFull text available from IEEE Electronic Library (IEL) Conference Proceedings
Subjects
Integrated circuits--Reliability. --Congresses.
Integrated circuits--Wafer-scale integration. --Reliability. --Congresses.

General note"IEEE Catalog No. 98TH8363"--verso of T.p.
Bibliography noteIncludes bibliographical references.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
LCCN 98084868
ISBN0780348818 (softbound)
ISBN0780348826 (microfiche)

Availability

Library Location Call Number Status Item Actions
Electronic Resources ✔ Available