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111 2 a| IEEE International High-Level Design Validation and Test Workshop.=| ^A728177;

210 0 a| Proc.b| (IEEE Int. High-Lev. Des. Valid. Test Workshop Online);

222 0 a| Proceedingsb| (IEEE International High-Level Design Validation and Test Workshop Online);

240 10 a| Proceedings (Online)=| ^A728177;

245 10 a| Proceedingsh| [electronic resource] /c| IEEE International High-Level Validation and Test Workshop.;

246 1 i| Title on IEEExplore conference web page:a| High-Level Design Validation and Test Workshop, IEEE International;

260 a| Los Alamitos, Calif. :b| IEEE Computer Society;

310 a| Annual;

362 1 a| Began in 1996.;

506 a| Available only to authorized users.;

515 a| Volumes for 2001-2006 also called: 7th-11th.;

530 a| Also available in print.;

538 a| Mode of access: World Wide Web.;

550 a| Sponsored by: IEEE Computer Society Technical Council on Test Technology <2000-2008>; IEEE Computer Society Technical Committee on Design Automation, <2000-2008>.;

588 0 a| 2000; title from PDF of title page (IEEExplore, viewed January 29, 2009).;

588 1 a| 2012 (IEEExplore, viewed April 6, 2016).;

650 0 a| Integrated circuitsx| Verificationv| Congresses.=| ^A413570;

650 0 a| Integrated circuitsx| Design and constructionv| Congresses.=| ^A534337;

650 0 a| Electronic circuitsx| Testingv| Congresses.=| ^A323721;

650 0 a| Microprocessorsx| Testingv| Congresses.=| ^A77773;

655 0 a| Electronic journals.=| ^A353035;

710 2 a| IEEE Computer Society.b| Technical Council on Test Technology.=| ^A728178;

710 2 a| IEEE Computer Society.b| Design Automation Technical Committee.=| ^A73828;

710 2 a| IEEE Xplore (Online service)=| ^A534875;

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Proceedings / IEEE International High-Level Validation and Test Workshop.

Author/creator	IEEE International High-Level Design Validation and Test Workshop
Other author	IEEE Computer Society. Technical Council on Test Technology.
Other author	IEEE Computer Society. Design Automation Technical Committee.
Other author	IEEE Xplore (Online service)
Format	Electronic
Publication Info	Los Alamitos, Calif. : IEEE Computer Society
Supplemental Content	Click here for full text
Subjects	Integrated circuits--Verification. --Congresses. Integrated circuits--Design and construction. --Congresses. Electronic circuits--Testing. --Congresses. Microprocessors--Testing. --Congresses.

Uniform title	Proceedings (Online)
Variant title	Title on IEEExplore conference web page: High-Level Design Validation and Test Workshop, IEEE International
Frequency	Annual
Access restriction	Available only to authorized users.
Special numbering	Volumes for 2001-2006 also called: 7th-11th.
Other forms	Also available in print.
Technical details	Mode of access: World Wide Web.
Issuing body	Sponsored by: IEEE Computer Society Technical Council on Test Technology <2000-2008>; IEEE Computer Society Technical Committee on Design Automation, <2000-2008>.
Source of description	2000; title from PDF of title page (IEEExplore, viewed January 29, 2009).
Source of description	2012 (IEEExplore, viewed April 6, 2016).
Issued in other form	Print version: IEEE International High-Level Design Validation and Test Workshop. Proceedings 1552-6674
Genre/form	Electronic journals.
LCCN	2009242130
ISSN	2471-7827 1552-6674

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Proceedings / IEEE International High-Level Validation and Test Workshop.

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