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130 0 a| IEEE design & test (Online)?| UNAUTHORIZED;

210 0 a| IEEE des. testb| (Online);

222 0 a| IEEE design & testb| (Online);

245 10 a| IEEE design & testh| [electronic resource].;

246 1 a| IEEE design and test;

260 a| New York, NY :b| Institute of Electrical and Electronics Engineers;

310 a| Six issues yearly;

362 1 a| Began with: Volume 30, number 1 (January/February 2013).;

506 a| Available only to authorized users.;

530 a| Also available in print.;

538 a| Mode of access: World Wide Web.;

550 a| Publication of the IEEE Circuits and Systems Society, IEEE Council on Electronic Design Automation, IEEE Solid State Circuits Society, and the IEEE Test Technology Technical Council.;

588 a| Description based on: Volume 30, number 1 (January/February 2013); title from cover PDF (IEEE, viewed Oct. 17, 2013).;

588 a| Latest issue consulted: Volume 31, issue 1 (Jan/Feb 2014) (IEEE, viewed Feb 26, 2014).;

650 0 a| Computer engineeringv| Periodicals.=| ^A1236874;

655 0 a| Electronic journals.=| ^A353035;

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710 2 a| IEEE Council on Electronic Design Automation.?| UNAUTHORIZED;

710 2 a| IEEE Solid-State Circuits Society.=| ^A729346;

710 2 a| IEEE Computer Society.b| Technical Council on Test Technology.=| ^A728178;

710 2 a| IEEE Xplore (Online service)=| ^A534875;

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IEEE design & test

Format	Electronic
Publication Info	New York, NY : Institute of Electrical and Electronics Engineers
Supplemental Content	Click here for full text
Subjects	Computer engineering--Periodicals.

Other author/creator	Institute of Electrical and Electronics Engineers.
Other author/creator	IEEE Circuits and Systems Society. https://id.oclc.org/worldcat/entity/E39QQPVp7TFPCbBGyTKjDhb4kt.
Other author/creator	IEEE Council on Electronic Design Automation.
Other author/creator	IEEE Solid-State Circuits Society.
Other author/creator	IEEE Computer Society. Technical Council on Test Technology.
Other author/creator	IEEE Xplore (Online service)
Uniform title	IEEE design & test (Online)
Variant title	IEEE design and test
Frequency	Six issues yearly
Access restriction	Available only to authorized users.
Other forms	Also available in print.
Technical details	Mode of access: World Wide Web.
Issuing body	Publication of the IEEE Circuits and Systems Society, IEEE Council on Electronic Design Automation, IEEE Solid State Circuits Society, and the IEEE Test Technology Technical Council.
Source of description	Description based on: Volume 30, number 1 (January/February 2013); title from cover PDF (IEEE, viewed Oct. 17, 2013).
Source of description	Latest issue consulted: Volume 31, issue 1 (Jan/Feb 2014) (IEEE, viewed Feb 26, 2014).
Preceding title	IEEE design & test of computers (Online) 1558-1918
Issued in other form	Print version: IEEE design & test (Print) 2168-2356
Genre/form	Electronic journals.
LCCN	2012200562
ISSN	2168-2364 2168-2356
Stock number	3 Park Avenue, 17th Floor, New York, NY 10016-5997

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IEEE design & test

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