The effect of experimental variables on industrial X-ray micro-computed sensitivity / Donald J. Roth, Richard W. Rauser.

Author/creator Roth, Don J. author.
Other author Rauser, Richard W., author.
Other author NASA Glenn Research Center, issuing body.
Format Electronic
PublicationCleveland, Ohio : National Aeronautics and Space Administration, Glenn Research Center, December 2014.
Description1 online resource (37 pages) : color illustrations.
Supplemental Contenthttps://purl.fdlp.gov/GPO/gpo57382

SeriesNASA/TM ; 2014-218332
NASA technical memorandum 2014-218332. ^A467613
General noteTitle from title screen (viewed on May 15, 2015).
General note"December 2014."
General noteGPO Cataloging Record Distribution Program (CRDP).
Bibliography noteIncludes bibliographical references (page 37).
GPO item number0830-D (online)
Govt. docs number NAS 1.15:2014-218332

Availability

Library Location Call Number Status Item Actions
Electronic Resources Access Content Online ✔ Available