Properties of material in the submillimeter wave region (instrumemtation and measurement of index of refraction) / principal investigators: J. Lally and R. Meister.
| Author/creator | Lally, J. author. |
| Other author | Meister, R., author. |
| Other author | Catholic University of America. Department of Electrical Engineering, issuing body. |
| Other author | United States. National Aeronautics and Space Administration sponsoring body. |
| Format | Electronic |
| Publication | [Washington, District of Columbia] : Department of Electrical Engineering, Catholic University of America : National Aeronautics and Space Administration, 11 July 1983. |
| Description | 1 online resource (16, 3 unnumbered pages) : illustrations. |
| Supplemental Content | https://purl.fdlp.gov/GPO/gpo51162 |
| Portion of title | Instrumemtation and measurement of index of refraction |
| Series | NASA-CR ; 175156 NASA contractor report ; NASA CR-175156. ^A441636 |
| General note | Title from title screen (viewed on Sept. 11, 2014). |
| General note | "11 July 1993." |
| Bibliography note | Includes bibliographical references (pages 7-9). |
| Report note | Final report; August 1977-August 1980. |
| Funding information | Sponsored by the National Aeronautics and Space Administration NSG-5111 |
| Issued in other form | Microfiche version: Lally, J. Properties of material in the submillimeter wave region (instrumentation and measurement of index of refraction) |
| GPO item number | 0830-H-14 (online) |
| Govt. docs number | NAS 1.26:175156 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | Access Content Online | ✔ Available |