Applied logistic regression / David W. Hosmer, Jr., Stanley Lemeshow.

Author/creator Hosmer, David W.
Other author Lemeshow, Stanley.
Format Book
Publication InfoNew York : Wiley, ©1989.
Descriptionxiii, 307 pages ; 24 cm.
Subjects

SeriesWiley series in probability and mathematical statistics. Applied probability and statistics section
Wiley series in probability and mathematical statistics. Applied probability and statistics. ^A1552
General note"A Wiley-Interscience publication."
Bibliography noteIncludes bibliographical references (p. 291-300) and index.
LCCN 89031893
ISBN0471615536

Availability

Library Location Call Number Status Item Actions
Joyner General Stacks QA278.2 .H67 1989 ✔ Available Place Hold