Modeling minority-carrier lifetime techniques that use transient excess-carrier decay / Steven W. Johnston, Gregory M. Berman, and Richard K. Ahrenkiel.

Author/creator Johnston, Steven W.
Format Electronic
Publication InfoGolden, Colo. : National Renewable Energy Laboratory, 2008.
Description1 online resource ([1] p.) : col. ill.
Supplemental Contenthttps://purl.fdlp.gov/GPO/gpo25335
Subjects

Other author/creatorBerman, Gregory M.
Other author/creatorAhrenkiel, Richard K.
Other author/creatorNational Renewable Energy Laboratory (U.S.)
Other author/creatorIEEE Photovoltaic Specialists Conference 2008 : San Diego, Calif.) (33rd :
SeriesNREL/PO ; 520-43308
NREL/PO 520-43308. ^A782221
General notePresented at the 33rd IEEE Photovoltaic Specialist Conference, 11-16 May 2008, San Diego, California.
General noteTitle from title screen (viewed on July 16, 2012).
General noteGPO Cataloging Record Distribution Program (CRDP).
GPO item number0430-P-17 (online)
Govt. docs number E 9.28:NREL/PO-520-43308

Availability

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Electronic Resources Access Content Online ✔ Available