In the matter of certain probe card assemblies, components thereof and certain tested DRAM an NAND flash memory devices and products containing same : investigation no. 337-TA-621.
| Author/creator | United States International Trade Commission |
| Format | Electronic |
| Publication Info | Washington, DC : U.S. International Trade Commission, [2010] |
| Description | 1 online resource ([243] p.) : ill. |
| Supplemental Content | https://purl.fdlp.gov/GPO/gpo15315 |
| Subjects |
| Portion of title | Probe card assemblies, components thereof and certain tested DRAM an NAND flash memory devices and products containing same |
| Series | Publication ; 4149 USITC publication ; 4149. ^A385265 |
| General note | Title from title screen (viewed on Nov. 17, 2011). |
| General note | "June 2010." |
| General note | Includes bibliographical references. |
| General note | GPO Cataloging Record Distribution Program (CRDP). |
| Issued in other form | Print version: United States International Trade Commission. In the matter of certain probe card assemblies, components thereof and certain tested DRAM and NAND flash memory devices and products containing same |
| GPO item number | 0980-E (online) |
| Govt. docs number | ITC 1.12:337-TA-621 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | Access Content Online | ✔ Available |