Pulsed capacitance measurement of silicon carbide (SiC) Schottky diode and SiC metal oxide semiconductor / by Timothy E. Griffin.
| Author/creator | Griffin, Timothy E. |
| Other author | U.S. Army Research Laboratory. |
| Format | Electronic |
| Publication Info | Adelphi, MD : Army Research Laboratory, [2006] |
| Description | 1 online resource (vi, 22 pages) : illustrations. |
| Supplemental Content | https://purl.fdlp.gov/GPO/LPS125608 |
| Subjects |
| Series | ARL-TR ; 3993 ARL-TR (Aberdeen Proving Ground, Md.) ; 3993. ^A566074 |
| General note | Title from PDF title screen (ARL, viewed Mar. 23, 2010). |
| General note | "November 2006." |
| Report note | Final rpt. ; Mar. to May 2006. |
| GPO item number | 0324-A-01 (online) |
| Govt. docs number | D 101.133:3993 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | Access Content Online | ✔ Available |