Tools

LEADER 01212cam a2200349 a 4500

001 ocm11650168;

005 20141212045343.0;

008 850116s1985 maua b 001 0 eng ;

010 a| 85000084;

020 a| 0262060965;

035 a| (Sirsi) o11650168;

035 a| (OCoLC)11650168;

040 a| DLCc| DLCd| EREd| UtOrBLW;

049 a| EREE;

050 00 a| TK7868.L6b| F85 1985;

082 0 a| 621.3815/372| 19;

100 1 a| Fujiwara, Hideo.=| ^A159387;

245 10 a| Logic testing and design for testability /c| Hideo Fujiwara.;

300 a| x, 284 pages :b| illustrations ;c| 24 cm.;

336 a| text2| rdacontent;

337 a| unmediated2| rdamedia;

338 a| volume2| rdacarrier;

490 1 a| MIT Press series in computer systems;

500 a| Includes index.;

504 a| Bibliography: p. [272]-278.;

650 0 a| Logic circuitsx| Testing.=| ^A33749;

830 0 a| MIT Press series in computer systems.=| ^A221359;

919 a| BOOK;

596 a| 1;

998 a| 217161;

999 a| TK7868.L6 F85 1985w| LCc| 1i| 30372003779870d| 4/3/2013e| 5/31/1996f| 4/3/2013g| 2l| JGESm| JOYNERn| 1r| Ys| Yt| JGESBKu| 2/27/1989x| BOOKz| JSTACKSo| .STAFF. 0o| .STAFF. Copy Statement : c.1;

Logic testing and design for testability / Hideo Fujiwara.

Author/creator	Fujiwara, Hideo
Format	Book
Publication Info	Cambridge, Mass. : MIT Press, ©1985.
Description	x, 284 pages : illustrations ; 24 cm.
Subjects	Logic circuits--Testing.

Series	MIT Press series in computer systems MIT Press series in computer systems. ^A221359
General note	Includes index.
Bibliography note	Bibliography: p. [272]-278.
LCCN	85000084
ISBN	0262060965

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Library	Location	Call Number	Status	Item Actions
Joyner	General Stacks	TK7868.L6 F85 1985	✔ Available	Place Hold

Logic testing and design for testability / Hideo Fujiwara.

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