Theory and operation of cold field-effect transistor (FET) external parasitic parameter extraction / by Benjamin D. Huebschman, Pankaj B. Shah, and Romeo Del Rosario.
| Author/creator | Huebschman, Benjamin D. |
| Other author | Shah, Pankaj B. |
| Other author | Del Rosario, Romeo. |
| Other author | U.S. Army Research Laboratory. |
| Format | Electronic |
| Publication Info | Adelphi, MD : Army Research Laboratory, [2009] |
| Description | iv, 16 pages : digital, PDF file. |
| Supplemental Content | https://purl.fdlp.gov/GPO/LPS115049 |
| Subjects |
| Series | ARL-TR ; 4812 ARL-TR (Aberdeen Proving Ground, Md.) ; 4812. ^A566074 ARL/TR ; 4812. ^A567324 |
| General note | Title from title screen (viewed on July 20, 2009). |
| General note | "May 2009." |
| Technical details | Mode of access: Internet from the ARL web site. Address as of 7/20/09: http://www.arl.army.mil/arlreports/2009/ARL-TR-4812.pdf ; current access is available via PURL. |
| GPO item number | 0324-A-01 (online) |
| Govt. docs number | D 101.133:4812 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | Access Content Online | ✔ Available |