Unusual capacitance emission transients in CIGS caused by large defect entropy changes / D.L. Young, K. Ramanathan, and R.S. Crandall.

Author/creator Young, David L.
Other author Ramanathan, Kannan.
Other author Crandall, Richard S.
Other author National Renewable Energy Laboratory (U.S.)
Format Electronic
Publication InfoGolden, Colo. : National Renewable Energy Laboratory, [2005]
Description4 p. : digital, PDF file
Supplemental Contenthttps://purl.fdlp.gov/GPO/LPS69679
Subjects

SeriesConference paper ; NREL/CP-520-37359
Conference paper (National Renewable Energy Laboratory (U.S.)) ; NREL/CP-520-37359. ^A755847
Abstract Capacitance transient data from bias-pulse experiments on CdS/CIGS solar cells show an unusual behavior at high temperatures. Above 350 K, a minority-carrier trap, with a larger activation energy than a majority-carrier trap, emits faster than the lower activation-energy minority trap. A simple enthalpy model for trap emission cannot explain this counterintuitive behavior; but the more complete Gibbs free-energy model that includes entropy can explain it. We show that entropy plays a major role in carrier emission from traps in CIGS.
General noteTitle from title screen (viewed on May 9, 2006).
General note"February 2005."
General note2005-08-21.
General noteGPO Cataloging Record Distribution Program (CRDP).
Technical detailsMode of access: Internet from the NREL web site. Address as of 5/9/06: http://www.nrel.gov/docs/fy05osti/37359.pdf; current access available via PURL.
GPO item number0430-P-04 (online)
Govt. docs number E 9.17:NREL/CP-520-37359 E 9.18:NREL/CP-520-37359

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