AFM-based microelectrical characterization of grain boundaries in Cu(In,Ga)Se₂ thin films / C.-S. Jiang ... [et al.].
| Other author | Jiang, C. -S. |
| Other author | National Renewable Energy Laboratory (U.S.) |
| Format | Electronic |
| Publication Info | Golden, Colo. : National Renewable Energy Laboratory, [2005] |
| Description | 1 v. : digital, PDF file. |
| Supplemental Content | https://purl.fdlp.gov/GPO/LPS68173 |
| Subjects |
| Variant title | AFM based microelectrical characterization of grain boundaries in Cu(In,Ga)Se₂ thin films |
| Series | Conference paper ; NREL/CP-520-37338 Conference paper (National Renewable Energy Laboratory (U.S.)) ; NREL/CP-520-37338. ^A755847 |
| General note | Title from title screen (viewed on Mar. 27, 2006). |
| General note | "February 2005." |
| General note | GPO Cataloging Record Distribution Program (CRDP). |
| Technical details | Mode of access: Internet from the NREL web site. Address as of 3/27/06: http://www.nrel.gov/docs/fy05osti/37338.pdf; current access available via PURL. |
| GPO item number | 0430-P-04 (online) |
| Govt. docs number | E 9.17:NREL/CP-520-37338 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | Access Content Online | ✔ Available |