Tools

LEADER 02398cam a2200457 a 4500

001 ocm11038737;

003 OCoLC;

005 20230330161854.0;

008 840809s1972 dcua bt f000 0 eng d;

019 a| 897989733;

049 a| ERE#;

050 4 a| TK8330b| .M3;

074 a| 0249-A;

086 0 a| C 13.46:736;

088 a| NBS-TN-736;

100 1 a| Mattis, Richard L.0| https://id.loc.gov/authorities/names/n83169673e| author.=| ^A598123;

245 10 a| Carrier lifetime measurement by the photoconductive decay method /c| Richard L. Mattis and A. James Baroody, Jr.;

264 1 a| Washington, D.C. :b| U.S. Dept. of Commerce, National Bureau of Standards :b| For sale by the Supt. of Docs., U.S. G.P.O.,c| 1972.;

300 a| 40 pages in various pagings :b| illustrations ;c| 26 cm;

336 a| textb| txt2| rdacontent;

337 a| unmediatedb| n2| rdamedia;

338 a| volumeb| nc2| rdacarrier;

490 1 a| NBS technical note ;v| 736;

500 a| "Issued September 1972.";

500 a| "A United States Department of Commerce publication."--Cover;

500 a| "Carried out as part of the Joint Program on Methods of Measurement for Semiconductor Materials, Process Control, and Devices.";

500 a| Sponsored by the National Bureau of Standards and others.;

504 a| Includes bibliographical references (pages 36-39).;

500 a| GPO Historic Shelflist Project- publication not in hand.;

500 a| GPO Cataloging Record Distribution Program (CRDP).;

650 0 a| Photoconductivity.0| https://id.loc.gov/authorities/subjects/sh85101152=| ^A26180;

650 0 a| Photoelectric cells.0| https://id.loc.gov/authorities/subjects/sh85101160=| ^A152290;

650 0 a| Semiconductors.0| https://id.loc.gov/authorities/subjects/sh85119903=| ^A16124;

700 1 a| Baroody, A. James,c| Jr.0| https://id.loc.gov/authorities/names/no2021001596e| author.=| ^A1450984;

830 0 a| NBS technical note ;0| https://id.loc.gov/authorities/names/n42033257v| 736.=| ^A4336;

949 a| C 13.46:736w| sudoch| joyner38;

596 a| 1;

998 a| 1008971;

999 a| C 13.46:736w| SUDOCc| 1i| 30372012774961d| 9/13/2005l| JDOSm| JOYNERr| Ys| Yt| JDOSBKu| 9/13/2005x| BOOKz| JFEDDOCSo| .STAFF. 0;

Carrier lifetime measurement by the photoconductive decay method / Richard L. Mattis and A. James Baroody, Jr.

Author/creator	Mattis, Richard L. author.
Other author	Baroody, A. James, Jr. author.
Other author	United States. National Bureau of Standards, issuing body.
Format	Book
Publication	Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O., 1972.
Description	40 pages in various pagings : illustrations ; 26 cm
Subjects	Photoconductivity. Photoelectric cells. Semiconductors.

Series	NBS technical note ; 736 NBS technical note ; https://id.loc.gov/authorities/names/n42033257 736. ^A4336
General note	"Issued September 1972."
General note	"A United States Department of Commerce publication."--Cover
General note	"Carried out as part of the Joint Program on Methods of Measurement for Semiconductor Materials, Process Control, and Devices."
General note	Sponsored by the National Bureau of Standards and others.
General note	GPO Historic Shelflist Project- publication not in hand.
General note	GPO Cataloging Record Distribution Program (CRDP).
Bibliography note	Includes bibliographical references (pages 36-39).
Technical rpt number	NBS-TN-736
GPO item number	0249-A
Govt. docs number	C 13.46:736

Library	Location	Call Number	Status	Item Actions
Joyner	Fed Docs Stacks	C 13.46:736	✔ Available	Place Hold

Click here for more information about this title