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LEADER 01718cam a2200397Ia 4500

001 ocm09472785;

003 OCoLC;

005 20230105084242.0;

008 830503s1964 dcua b f000 0 eng d;

049 a| ERE#;

074 a| 0249-A;

086 0 a| C 13.46:242;

100 1 a| McCrackin, F. L.q| (Frank L.)=| ^A1451156;

245 12 a| A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films /c| Frank L. McCrackin and James P. Colson.;

264 1 a| Washington, D.C. :b| National Bureau of Standards,c| 1964.;

300 a| ii, 42 pages :b| diagrams ;c| 26 cm;

336 a| textb| txt2| rdacontent;

337 a| unmediatedb| n2| rdamedia;

338 a| volumeb| nc2| rdacarrier;

490 1 a| NBS technical note ;v| 242;

504 a| Includes bibliographical references.;

500 a| Issued May 27, 1964.;

500 a| GPO Historic Shelflist Project- publication not in hand.;

500 a| GPO Cataloging Record Distribution Program (CRDP).;

650 0 a| Thin filmsx| Optical properties.=| ^A207459;

650 0 a| FORTRAN (Computer program language)=| ^A20341;

650 7 a| FORTRAN (Computer program language)2| fast0| (OCoLC)fst00919336;

650 7 a| Thin filmsx| Optical properties.2| fast0| (OCoLC)fst01150034;

700 1 a| Colson, James P.=| ^A1477541;

710 1 a| United States.b| National Bureau of Standards.=| ^A44678;

830 0 a| NBS technical note ;v| 242.=| ^A4336;

949 a| C 13.46:242w| sudoch| joyner38;

596 a| 1;

998 a| 1006716;

999 a| C 13.46:242w| SUDOCc| 1i| 30372013414302d| 8/23/2005l| JDOSm| JOYNERr| Ys| Yt| JDOSBKu| 8/23/2005x| BOOKz| JFEDDOCSo| .STAFF. 0;

A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films / Frank L. McCrackin and James P. Colson.

Author/creator	McCrackin, F. L.
Other author	Colson, James P.
Other author	United States. National Bureau of Standards.
Format	Book
Publication	Washington, D.C. : National Bureau of Standards, 1964.
Description	ii, 42 pages : diagrams ; 26 cm
Subjects	Thin films--Optical properties. FORTRAN (Computer program language)

Series	NBS technical note ; 242 NBS technical note ; 242. ^A4336
General note	Issued May 27, 1964.
General note	GPO Historic Shelflist Project- publication not in hand.
General note	GPO Cataloging Record Distribution Program (CRDP).
Bibliography note	Includes bibliographical references.
GPO item number	0249-A
Govt. docs number	C 13.46:242

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Library	Location	Call Number	Status	Item Actions
Joyner	Fed Docs Stacks	C 13.46:242	✔ Available	Place Hold

A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films / Frank L. McCrackin and James P. Colson.

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