Calculations for comparing two-point and four-point probe resistivity measurements on rectangular bar-shaped semiconductor samples.
| Author/creator | Swartzendruber, Lydon J. |
| Format | Book |
| Publication Info | Washington : [U.S. Dept. of Commerce, National Bureau of Standards]; for sale by the Superintendent of Documents, Govt. Print. Off, 1964. |
| Description | 25 pages : illustrations ; 27 cm. |
| Subjects |
| Series | NBS technical note ; 241 NBS technical note 241. ^A4336 |
| Govt. docs number | C 13.46:241 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Joyner | Fed Docs Stacks | C 13.46:241 | ✔ Available | Place Hold |