Trace characterization, chemical and physical / W. Wayne Meinke and Bourdon F. Scribner, editors [from the] Institute for Materials Research.
| Author/creator | Materials Research Symposium |
| Other author | Meinke, W. Wayne, editor. |
| Other author | Scribner, Bourdon F. (Bourdon Francis), 1910-2007 editor. |
| Other author | Institute for Materials Research (U.S.) |
| Format | Book |
| Publication Info | [Washington] : Dept. of Commerce, National Bureau of Standards; for sale by the Supt. of Docs., U.S. Govt. Print. Off, 1967. |
| Description | xiii, 580 pages : illustrations ; 25 cm. |
| Subjects |
| Series | National Bureau of Standards monograph 100 NBS monograph ; 100. ^A329613 |
| Partial contents | Trace characterization and the properties of materials / Hannay, N.B. -- Electrical measurements for trace characterization / Weisberg, L.R. -- Trace characterization by electrochemical methods / Laitinen, H.A. -- Optical and x-ray spectroscopy / Addink, N.W.H. -- Effects of trace impurities on x-ray diffraction / Chikawa, J, and Newkirk, J.B. -- Chemical spectrophotometry in trace characterization / West, T.S. -- Radioactivity techniques in trace characterization / Smales, A.A. -- Spark source mass spectrometric analysis of solids / Ahearn, A.J. -- Preconcentration in trace analysis / Minczewski, J. -- The study of crystal imperfections by means of optical methods and by means of electron microscopy and electron diffraction / Amelinckx, S. |
| General note | "Based on lectures and discussions of the 1st Materials Research Symposium held at the NBS, Gaithersburg, Maryland, October 3-7, 1966." |
| Bibliography note | Includes bibliographies. |
| LCCN | 66062907 |
| Govt. docs number | C 13.44:100 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Joyner | Fed Docs Stacks | C 13.44:100 | ✔ Available | Place Hold |