"Microelectronics+Quality control." - ECU Libraries Catalog

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Cover image for Techniques for measuring the integrity of passivation overcoats on integrated circuits

Techniques for measuring the integrity of passivation overcoats on integrated circuits

by Kern, Werner, 1925-
1977
Format: Book

Location	Call #	Status
Joyner - Fed Docs Stacks	C 13.10:400-31	✔ Available

Cover image for Electronics reliability and measurement technology

Electronics reliability and measurement technology

by Electronics Reliability and Measurement Technology Workshop
1987
Format: Book

Location	Call #	Status
Joyner - Microforms B300	NAS 1.55:2472	✔ Available

Cover image for The committee's investigation into counterfeit electronic parts in the Department of Defense supply chain

The committee's investigation into counterfeit electronic parts in the Department of Defense supply chain

by United States
2012
Format: Electronic

Location
Access Content Online

Cover image for Inquiry into counterfeit electronic parts in the Department of Defense supply chain

Inquiry into counterfeit electronic parts in the Department of Defense supply chain

by United States
2012
Format: Electronic

Location
Access Content Online