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Software engineering measures for predicting software reliability in safety critical digital systems
| Location | Call # | Status |
|---|---|---|
| Joyner - Microforms B300 | Y 3.N 88:58/0019 | ✔ Available |
Embedded digital system reliability and safety analyses
| Location | Call # | Status |
|---|---|---|
| Joyner - Microforms B300 | Y 3.N 88:58/0020 | ✔ Available |
Data and results of a laboratory investigation of microprocessor upset caused by simulated lightning-induced analog transients
| Location | Call # | Status |
|---|---|---|
| Joyner - Microforms B300 | NAS 1.15:85821 | ✔ Available |