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Cover image for Uncertainties in NIST noise-temperature measurements

Uncertainties in NIST noise-temperature measurements

Location Call # Status
Joyner - Microforms B300 C 13.46:1502 ✔ Available
Cover image for Noise-temperature measurement system for the WR-28 band

Noise-temperature measurement system for the WR-28 band

Location Call # Status
Joyner - Microforms B300 C 13.46:1395 ✔ Available
Cover image for Noise temperature measurements on wafer

Noise temperature measurements on wafer

Location Call # Status
Joyner - Microforms B300 C 13.46:1390 ✔ Available
Cover image for Possible estimation methodologies for electromagnetic field distributions in complex environments

Possible estimation methodologies for electromagnetic field distributions in complex environments

Location Call # Status
Joyner - Microforms B300 C 13.46:1081 ✔ Available