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Cover image for EMR test facilities evaluation of a small reverberating chamber located at RADC, Griffiss AFB, Rome, New York

EMR test facilities evaluation of a small reverberating chamber located at RADC, Griffiss AFB, Rome, New York

Location Call # Status
Joyner - Microforms B300 C 13.58:90-3939 ✔ Available
Cover image for Spherical near-field scanning

Spherical near-field scanning

Location Call # Status
Joyner - Microforms B300 C 13.58:90-3955 ✔ Available
Cover image for Near-field and far-field excitation of a long conductor in a lossy medium

Near-field and far-field excitation of a long conductor in a lossy medium

Location Call # Status
Joyner - Microforms B300 C 13.58:90-3954 ✔ Available
Cover image for Possible designs for electric-field-strength probes for millimeter waves

Possible designs for electric-field-strength probes for millimeter waves

Location Call # Status
Joyner - Microforms B300 C 13.58:88-3084 ✔ Available
Cover image for Development of near-field test procedures for communication satellite antennas

Development of near-field test procedures for communication satellite antennas

Location Call # Status
Joyner - Microforms B300 C 13.58:87-3081/PHASE 1/PT. 2 ✔ Available
Cover image for Energy related inventions program

Energy related inventions program

Location Call # Status
Joyner - Fed Docs Stacks C 13.2:EN 2/8 ✔ Available
Cover image for Electrical properties of materials and their measurement at low temperatures

Electrical properties of materials and their measurement at low temperatures

Location Call # Status
Joyner - Microforms B300 C 13.46:1053 ✔ Available
Cover image for Input impedance of a probe antenna exciting a TEM cell

Input impedance of a probe antenna exciting a TEM cell

Location Call # Status
Joyner - Microforms B300 C 13.46:1054 ✔ Available
Cover image for A systems programmer's guide for installing OMNITAB 80

A systems programmer's guide for installing OMNITAB 80

Location Call # Status
Joyner - Microforms B300 C 13.46:1163 ✔ Available
Cover image for Measurement assurance for dimensional measurements on integrated-circuit photomasks

Measurement assurance for dimensional measurements on integrated-circuit photomasks

Location Call # Status
Joyner - Microforms B300 C 13.46:1164 ✔ Available