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A BASIC program for calculating dopant density profiles from capacitance-voltage data
| Location | Call # | Status |
|---|---|---|
| Joyner - Fed Docs Stacks | C 13.10:400-11 | ✔ Available |
Carrier lifetime measurement by the photoconductive decay method
| Location | Call # | Status |
|---|---|---|
| Joyner - Fed Docs Stacks | C 13.46:736 | ✔ Available |