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Cover image for Characterization of a high frequency probe assembly for integrated circuit measurement

Characterization of a high frequency probe assembly for integrated circuit measurement

Location Call # Status
Joyner - Fed Docs Stacks C 13.46:663 ✔ Available
Cover image for Measurement of transistor scattering parameters

Measurement of transistor scattering parameters

Location Call # Status
Joyner - Fed Docs Stacks C 13.10:400-5 ✔ Available