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A lexical analogy to feature matching and pose estimation
| Location | Call # | Status |
|---|---|---|
| Joyner - Microforms B300 | C 13.58:6790 | ✔ Available |
Distributed testing of a device-level interface specification for a metrology system
| Location | Call # | Status |
|---|---|---|
| Joyner - Microforms B300 | C 13.58:6851 | ✔ Available |
A comparison of the CMM-driver specification release #1.9 with the I++ DME-interface release 0.9
| Location | Call # | Status |
|---|---|---|
| Joyner - Microforms B300 | C 13.58:6863 | ✔ Available |