Start Over
You searched for: author_facet Hoer, Cletus A.

Search Results

Cover image for Systematic errors in power measurements made with a dual six-port ANA

Systematic errors in power measurements made with a dual six-port ANA

Location Call # Status
Joyner - Microforms B300 C 13.46:1332 ✔ Available
Cover image for Calibrating a six-port reflectometer with four impedance standards

Calibrating a six-port reflectometer with four impedance standards

Location Call # Status
Joyner - Fed Docs Stacks C 13.46:1012 ✔ Available
Cover image for Calibrating two 6-port reflectometers with only one impedance standard

Calibrating two 6-port reflectometers with only one impedance standard

Location Call # Status
Joyner - Fed Docs Stacks C 13.46:1004 ✔ Available
Cover image for Characterization of a high frequency probe assembly for integrated circuit measurement

Characterization of a high frequency probe assembly for integrated circuit measurement

Location Call # Status
Joyner - Fed Docs Stacks C 13.46:663 ✔ Available
Cover image for Using six-port and eight-port junctions to measure active and passive circuit parameters

Using six-port and eight-port junctions to measure active and passive circuit parameters

Location Call # Status
Joyner - Fed Docs Stacks C 13.46:673 ✔ Available