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Fundamentals of electrochemistry
| Location | Call # | Status |
|---|---|---|
| Joyner - General Stacks | QD553 .B23 2006 | ✔ Available |
Electron beam induced damage in PECVD Si₃N₄ and SiO₂ films on InP
| Location | Call # | Status |
|---|---|---|
| Joyner - Microforms B300 | NAS 1.15:102544 | ✔ Available |
/LC.GIF&client=easterncarolinaedu)
Electrets, charge storage, and transport in dielectrics
| Location | Call # | Status |
|---|---|---|
| Joyner - General Stacks | QC585.8.E4 I58 1972 | ✔ Available |