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An automated photovoltaic system for the measurement of resistivity variations, in high-resistivity circular silicon slices
| Location | Call # | Status |
|---|---|---|
| Joyner - Fed Docs Stacks | C 13.10:400-52 | ✔ Available |
Safe operating area limits for power transistors
| Location | Call # | Status |
|---|---|---|
| Joyner - Fed Docs Stacks | C 13.10:400-44 | ✔ Available |