ECU Libraries Catalog

Proceedings of the ... International Symposium on the Physical & Failure Analysis of Integrated Circuits .

Author/creator International Symposium on the Physical & Failure Analysis of Integrated Circuits
Format Electronic, Book, and Journal
Publication InfoPiscataway, N.J. : IEEE Service Center
Supplemental Content Click here for full text
Subject(s)
Other author/creatorInstitute of Electrical and Electronics Engineers.
Other author/creatorIEEE Singapore Section.
Other author/creatorIEEE Electron Devices Society.
Other author/creatorIEEE Xplore (Online service)
Uniform titleProceedings of the ... International Symposium on the Physical & Failure Analysis of Integrated Circuits (Online)
Other title IPFA ... proceedings
Other title Proceedings of the ... International Symposium on the Physical and Failure Analysis of Integrated Circuits
Other title International Symposium on the Physical and Failure Analysis of Integrated Circuits
Access restrictionAvailable only to authorized users.
Other formsAlso available in print.
Technical detailsMode of access: World Wide Web.
Issuing bodyConference for <1995> organized by IEEE Singapore Section, co-sponsored by IEEE Electron Devices Society.
Source of descriptionDescription based on: 5th ('95); title from caption (IEEEexplore website, viewed Jan. 8, 2008).
Source of descriptionLatest issue consulted: 15th (2008) (surrogate).
Issued in other formPrint version: International Symposium on the Physical & Failure Analysis of Integrated Circuits. Proceedings of the ... International Symposium on the Physical & Failure Analysis of Integrated Circuits 1946-1542
Genre/formElectronic journals.
LCCN 2009200004
ISSN1946-1550 1946-1542
Stock numberIEEE, 445 Hoes Ln., Piscataway, NJ 08854

Available Items

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Electronic Resources Access Content Online ✔ Available