LEADER 01208cam  22003378a 4500001    17917864
005    20141212014636.0
008    880428s1988    nyua     b    001 0 enged
010       88015217
020    0306428636 : |c$40.50
035    (Sirsi) H437550
035    (OCoLC)17981404
040    NLM |cNLM |dNEH |dUtOrBLW
049    NEHH
245 00 Artifacts in biological electron microscopy / |cedited by Richard F.E. Crang and Karen L. Klomparens.
260    New York : |bPlenum Press, |c©1988.
300    xix, 233 pages : |billustrations
336    text |2rdacontent
337    unmediated |2rdamedia
338    volume |2rdacarrier
504    Includes bibliographies and index.
650  2 Microscopy, Electron |xmethods. |=^A920825
650  2 Specimen Handling |xmethods. |=^A919818
700 1  Crang, Richard F. E. |=^A925218
700 1  Klomparens, Karen L. |=^A925219
919    BOOK
959    437550
096    QH 212 E4 A791 1988
596    4
998    1549076