LEADER 01577cam  2200421Ka 4500001    ocn166140852
003    OCoLC
005    20141208173853.0
008    070820s1985    ohu     b    f000 0 eng d
035    (Sirsi) o166140852
035    (OCoLC)166140852
040    GPO |cGPO |dMvI |dUtOrBLW
049    ERE$
074    0830-D (MF)
086 0  NAS 1.15:87164
100 1  Baaklini, George Y. |=^A439788
245 10 Probability of detection of internal voids in structural ceramics using microfocus radiography / |cGeorge Y. Baaklini and Don J. Roth.
260    [Cleveland, Ohio] : |b[National Aeronautics and Space Administration, Lewis Research Center], |c[1985]
300    1 volume.
336    text |2rdacontent
337    microform |2rdamedia
338    microfiche |2rdacarrier
490 1  NASA technical memorandum ; |v87164
533     |3Joyner-Microfiche. |b[Washington, D.C. : |cNational Aeronautics and Space Administration], |d1986. |e1 microfiche.
650  0 Silicon carbide. |=^A438451
650  0 Silicon nitride. |=^A213257
650  0 Ceramic materials. |=^A31424
650  7 Ceramics. |2nasat
650  7 Radiography. |2nasat
650  7 Sintering. |2nasat
650  7 Statistics. |2nasat
650  7 Voids. |2nasat
700 1  Roth, Don J. |=^A423945
710 2  Lewis Research Center. |=^A367825
830  0 NASA technical memorandum |v87164. |=^A467613
596    1
998    1094460