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Cover image for Diesel generator voltage regulation system component due to latent manufacturing defect

Diesel generator voltage regulation system component due to latent manufacturing defect

2010
Format: Electronic

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Cover image for U.S. EPA emission defect information and voluntary emission recall report system

U.S. EPA emission defect information and voluntary emission recall report system

2011
Format: Electronic

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Cover image for Defect Correction Methods for Fluid Flows at High Reynolds Numbers

Defect Correction Methods for Fluid Flows at High Reynolds Numbers

by Labovsky, Alexander E.
2025
1st ed.
Format: Electronic

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Cover image for Some points for consideration in the diagnosis of mental defect

Some points for consideration in the diagnosis of mental defect

by Auden, George A.
1889
Format: Electronic

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Cover image for Examining the GM recall and NHTSA's defect investigation process

Examining the GM recall and NHTSA's defect investigation process

by United States
2015
Format: Electronic

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Cover image for Defect/recall report system, user acceptance test phase summary

Defect/recall report system, user acceptance test phase summary

2010
Format: Electronic

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Cover image for Proceedings 1992 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems

Proceedings 1992 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems

2002
Format: Electronic

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Cover image for Modeling metallic precipitate dissolution in silicon under point defect injection

Modeling metallic precipitate dissolution in silicon under point defect injection

by Tan, T. Y.
2005
Format: Electronic

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Cover image for Motor Vehicle and Motor Vehicle Equipment Defect Notification Improvement Act

Motor Vehicle and Motor Vehicle Equipment Defect Notification Improvement Act

by United States
2000
Format: Book

Location	Call #	Status
Joyner - Fed Docs Stacks	ASK AT REFERENCE DESK	✔ Available

Cover image for 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

by IEEE Staff
2011
Format: Electronic

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