"Computer engineering+Standards." - ECU Libraries Catalog

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Cover image for Large hospital 50% energy savings

Large hospital 50% energy savings

2010
Format: Electronic

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Cover image for Systems Integration for Manufacturing Applications biennial report

Systems Integration for Manufacturing Applications biennial report

Format: Electronic

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Cover image for Systems Integration for Manufacturing Applications Program ... annual report

Systems Integration for Manufacturing Applications Program ... annual report

by Systems Integration for Manufacturing Applications Program (National Institute of Standards and Technology)
Format: Microform

Location	Call #	Status
Joyner - Microforms B300	C 13.58	✔ Available

Cover image for Development and testing of ENDF/B-VI.8 and ENDF/B-VII.0 coupled neutron-gamma libraries for SCALE 6

Development and testing of ENDF/B-VI.8 and ENDF/B-VII.0 coupled neutron-gamma libraries for SCALE 6

2009
Format: Electronic

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Cover image for Development of manufacturing systems models using VRML

Development of manufacturing systems models using VRML

by Krishnamurthy, Kasthurirangan
1997
Format: Microform

Location	Call #	Status
Joyner - Microforms B300	C 13.58:6093	✔ Available

Cover image for Process excellence using Lean Six-Sigma and Excel

Process excellence using Lean Six-Sigma and Excel

by Mehta, Merwan, 1959-
2023
Format: Book

Location	Call #	Status
Joyner - University Archives	TS176 .M44 2023	✔ Available

Cover image for Weekday and weekend day temporal allocation of activity in the draft NONROAD2004 model

Weekday and weekend day temporal allocation of activity in the draft NONROAD2004 model

2004
Format: Electronic

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Cover image for Weekday and weekend day temporal allocation of activity in the NONROAD model

Weekday and weekend day temporal allocation of activity in the NONROAD model

1999
Format: Electronic

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Cover image for Lean Six Sigma and statistical tools for engineers and engineering managers

Lean Six Sigma and statistical tools for engineers and engineering managers

by Zhan, Wei
2016
First edition
Format: Electronic

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