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Cover image for Bearing defect signature analysis using advanced nonlinear signal analysis in a controlled environment

Bearing defect signature analysis using advanced nonlinear signal analysis in a controlled environment

Location Call # Status
Joyner - Microforms B300 NAS 1.15:108491 ✔ Available
Cover image for The dependence of atomic oxygen undercutting of protected polyimide Kapton® H upon defect size

The dependence of atomic oxygen undercutting of protected polyimide Kapton® H upon defect size

Location Call # Status
Joyner - Microforms B300 NAS 1.15:210596 ✔ Available