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Cover image for Electron optical applications in materials science

Electron optical applications in materials science

Location Call # Status
Joyner - General Stacks TA418.5 .M87 ✔ Available
Cover image for Facility for interferometric testing of 1.25-m mirrors at liquid helium temperatures

Facility for interferometric testing of 1.25-m mirrors at liquid helium temperatures

Location Call # Status
Joyner - Microforms B300 NAS 1.15:101017 ✔ Available
Cover image for Reflective optics CPV panels enabling large scale, reliable generation of solar energy cost competitive with fossil fuels

Reflective optics CPV panels enabling large scale, reliable generation of solar energy cost competitive with fossil fuels

  • 2009
  • Format: Electronic
Location
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Cover image for Mechanical protection of DLC films on fused silica slides

Mechanical protection of DLC films on fused silica slides

Location Call # Status
Joyner - Microforms B300 NAS 1.15:87056 ✔ Available
Cover image for Interferometric metrology of photomask blanks

Interferometric metrology of photomask blanks

  • 2000
  • Format: Microform
Location Call # Status
Joyner - Microforms B300 C 13.58:6701 ✔ Available
Cover image for Introduction to optical testing

Introduction to optical testing

Location Call # Status
Joyner - General Stacks TS514 .G43 1993 ✔ Available
Cover image for Simple test procedure for image-based biometric verification systems

Simple test procedure for image-based biometric verification systems

Location Call # Status
Joyner - Microforms B300 C 13.58:6336 ✔ Available
Cover image for Automated photomask inspection

Automated photomask inspection

Location Call # Status
Joyner - Fed Docs Stacks C 13.10:400-46 ✔ Available
Cover image for Using high frequency focused water-coupled ultrasound for 3-D surface depression profiling

Using high frequency focused water-coupled ultrasound for 3-D surface depression profiling

  • 1999
  • Format: Book
Location Call # Status
Joyner - Microforms B300 NAS 1.15:209268 ✔ Available
Cover image for Simultaneous optical measurements of axial and tangential steady-state blade deflections

Simultaneous optical measurements of axial and tangential steady-state blade deflections

Location Call # Status
Joyner - Microforms B300 NAS 1.15:209051 ✔ Available