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Cover image for Basic measurement techniques for light microscopy

Basic measurement techniques for light microscopy

Location Call # Status
Joyner - General Stacks QH207 .B74 1991 ✔ Available
Cover image for Video microscopy applied to optical fiber geometry measurements

Video microscopy applied to optical fiber geometry measurements

Location Call # Status
Joyner - Microforms B300 C 13.46:1369 ✔ Available
Cover image for Transmission electron microscopy (TEM) sample preparation of Si[subscript 1-x]Ge[subscript x] in c-plane sapphire substrate

Transmission electron microscopy (TEM) sample preparation of Si[subscript 1-x]Ge[subscript x] in c-plane sapphire substrate

  • 2012
  • Format: Electronic
Location
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Cover image for Optical inspection of microsystems

Optical inspection of microsystems

  • 2019
  • 2nd edition
  • Format: Electronic
Location
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Cover image for Bright-chromium linewidth standard, SRM 476, for calibration of optical microscope linewidth measuring system

Bright-chromium linewidth standard, SRM 476, for calibration of optical microscope linewidth measuring system

Location Call # Status
Joyner - Microforms B300 C 13.10:260-114 ✔ Available