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Electron microprobe analysis
| Location | Call # | Status |
|---|---|---|
| Joyner - General Stacks | QD117.E42 R43 | ✔ Available |
Electron microprobe analysis
| Location | Call # | Status |
|---|---|---|
| Joyner - General Stacks | QD117.E42 R43 1993 | ✔ Available |
Microprobe characterization of optoelectronic materials
| Location | Call # | Status |
|---|---|---|
| Joyner - General Stacks | QC611.6.O6 M52 2003 | ✔ Available |
New frontiers in stable isotopic research
| Location | Call # | Status |
|---|---|---|
| Joyner - General Stacks | QE75 .B9 NO. 1890 | ✔ Available |
Beam optics of quadrupole probe-forming systems
| Location | Call # | Status |
|---|---|---|
| Joyner - General Stacks | QC389 .G74X 1984 | ✔ Available |
Secondary ion mass spectrometry
| Location | Call # | Status |
|---|---|---|
| Joyner - Fed Docs Stacks | C 13.10:427 | ✔ Available |