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Cover image for Electron microprobe analysis

Electron microprobe analysis

Location Call # Status
Joyner - General Stacks QD117.E42 R43 ✔ Available
Cover image for Electron microprobe analysis

Electron microprobe analysis

Location Call # Status
Joyner - General Stacks QD117.E42 R43 1993 ✔ Available
Cover image for Microprobe characterization of optoelectronic materials

Microprobe characterization of optoelectronic materials

Location Call # Status
Joyner - General Stacks QC611.6.O6 M52 2003 ✔ Available
Cover image for New frontiers in stable isotopic research

New frontiers in stable isotopic research

Location Call # Status
Joyner - General Stacks QE75 .B9 NO. 1890 ✔ Available
Cover image for Beam optics of quadrupole probe-forming systems

Beam optics of quadrupole probe-forming systems

Location Call # Status
Joyner - General Stacks QC389 .G74X 1984 ✔ Available
Cover image for Microbeam analysis

Microbeam analysis

Location Call # Status
Joyner - General Stacks QD98.E4 M5 ✔ Available
Cover image for Microprobe analysis

Microprobe analysis

Location Call # Status
Joyner - General Stacks QD98 .A48 ✔ Available
Cover image for Secondary ion mass spectrometry

Secondary ion mass spectrometry

Location Call # Status
Joyner - Fed Docs Stacks C 13.10:427 ✔ Available