"Integrated circuits+Very large scale integration.+Design." - ECU Libraries Catalog

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Cover image for VLSI test principles and architectures

VLSI test principles and architectures

2006
Format: Electronic

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Cover image for Proceedings of Technical Program of ... International Symposium on VLSI Design, Automation and Test

Proceedings of Technical Program of ... International Symposium on VLSI Design, Automation and Test

by International Symposium on VLSI Design, Automation, and Test
2005
Format: Electronic

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Cover image for 6th International Symposium on Quality Electronic Design

6th International Symposium on Quality Electronic Design

by International Symposium on Quality Electronic Design
2005
Format: Electronic

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Cover image for 8th International Symposium on Quality Electronic Design

8th International Symposium on Quality Electronic Design

by International Symposium on Quality Electronic Design
2007
Format: Electronic

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Cover image for Ninth International Symposium on Quality Electronic Design

Ninth International Symposium on Quality Electronic Design

by International Symposium on Quality Electronic Design
2008
Format: Electronic

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Fourth International Symposium on Quality Electronic Design

by International Symposium on Quality Electronic Design
2003
Format: Electronic

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Cover image for International Symposium on Quality Electronic Design

International Symposium on Quality Electronic Design

by International Symposium on Quality Electronic Design
2002
Format: Electronic

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Cover image for International Symposium on Quality Electronic Design

International Symposium on Quality Electronic Design

by International Symposium on Quality Electronic Design
2001
Format: Electronic

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Cover image for 7th International Symposium on Quality Electronic Design

7th International Symposium on Quality Electronic Design

by International Symposium on Quality Electronic Design
2006
Format: Electronic

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Cover image for Yield simulation for integrated circuits

Yield simulation for integrated circuits

by Walker, Duncan Moore Henry
1987
Format: Book

Location	Call #	Status
Joyner - General Stacks	TK7874 .W34 1987	✔ Available