"Electric cable sheathing+Defects.+Computer simulation." - ECU Libraries Catalog

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Cover image for Comparison of currents predicted by NASCAP/LEO model simulations with elementary Langmuir-type bare probe models for an insulated cable containing a single pinhole

Comparison of currents predicted by NASCAP/LEO model simulations with elementary Langmuir-type bare probe models for an insulated cable containing a single pinhole

by Galofaro, J.
1990
Format: Microform

Location	Call #	Status
Joyner - Microforms B300	NAS 1.15:102486	✔ Available