"Diffraction patterns+Analysis." - ECU Libraries Catalog

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$Cover image for Understanding transmission electron microscopy diffraction patterns obtained from infrared semiconductor materials$

Understanding transmission electron microscopy diffraction patterns obtained from infrared semiconductor materials

by Sarney, Wendy L.
2003
Format: Electronic

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Cover image for Measurement of the configuration of a concave surface by the interference of reflected light

Measurement of the configuration of a concave surface by the interference of reflected light

by Kumazawa, Tetsuo
1985
Format: Microform

Location	Call #	Status
Joyner - Microforms B300	NAS 1.15:77796	✔ Available

Cover image for Recent advances in scientific computing and applications

Recent advances in scientific computing and applications

by International Conference on Scientific Computing and Applications
2013
Format: Electronic

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