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A structured approach to systems testing
| Location | Call # | Status |
|---|---|---|
| Joyner - General Stacks | QA76.6 .P468 1988 | ✔ Available |
Fault detection in digital circuits
| Location | Call # | Status |
|---|---|---|
| Joyner - General Stacks | TK7887 .F75 | ✔ Available |
Fault diagnosis of digital systems
| Location | Call # | Status |
|---|---|---|
| Joyner - General Stacks | TK7887 .C47 | ✔ Available |
Simple test procedure for image-based biometric verification systems
| Location | Call # | Status |
|---|---|---|
| Joyner - Microforms B300 | C 13.58:6336 | ✔ Available |
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