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Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching
| Location | Call # | Status |
|---|---|---|
| Joyner - General Stacks | QH212.A78 K38 2006 | ✔ Available |
Simulation of tip-sample interaction in the atomic force microscope
| Location | Call # | Status |
|---|---|---|
| Joyner - Microforms B300 | NAS 1.15:111699 | ✔ Available |