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Format

  • Electronic7

Library Location

  • Joyner Library7

Publication Date

  • 2010-20197

Call Number

    Collection

    • Joyner E-Resources7

    Language

    • English7

    Genre

    • Congresses3

    Era

      Region

      • United States4

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      You searched for: subject "Accelerated life testing+Research." Remove constraint
      Showing 1 - 7 of 7 results
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      Cover image for Stability of CIGS solar cells and component materials evaluated by a step-stress accelerated degradation test method

      Stability of CIGS solar cells and component materials evaluated by a step-stress accelerated degradation test method

      • by Pern, F. J., 1952-
      • 2012
      • Format: Electronic
      Location
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      Cover image for Using accelerated testing to predict module reliability

      Using accelerated testing to predict module reliability

      • by Wohlgemuth, J., 1946-
      • 2011
      • Format: Electronic
      Location
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      Cover image for International PV QA Task Force (PVQAT)

      International PV QA Task Force (PVQAT)

      • by Kurtz, Sarah
      • 2014
      • Format: Electronic
      Location
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      Cover image for Performance and reliability of bonded interfaces for high-temperature packaging

      Performance and reliability of bonded interfaces for high-temperature packaging

      • by DeVoto, Douglas
      • 2014
      • Format: Electronic
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      Cover image for Performance and reliability of bonded interfaces for high-temperature packaging

      Performance and reliability of bonded interfaces for high-temperature packaging

      • 2018
      • Format: Electronic
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      Cover image for Performance and reliability of bonded interfaces for high-temperature packaging

      Performance and reliability of bonded interfaces for high-temperature packaging

      • by DeVoto, Douglas
      • 2014
      • Format: Electronic
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      Cover image for Thermal performance and reliability characterization of bonded interface materials (BIMs)

      Thermal performance and reliability characterization of bonded interface materials (BIMs)

      • by DeVoto, Douglas
      • 2014
      • Format: Electronic
      Location
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