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Cover image for Determining the presence of ordering in ternary semiconductor alloys grown by molecular beam epitaxy

Determining the presence of ordering in ternary semiconductor alloys grown by molecular beam epitaxy

by Sarney, Wendy L.
2013
Format: Electronic

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Cover image for Materials research of perovskite thin films for uncooled infrared (IR) detectors

Materials research of perovskite thin films for uncooled infrared (IR) detectors

by Sarney, Wendy L.
2011
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Cover image for Progress in materials synthesis and processing of barium titanium oxide (BaTiO3) and barium strontium titanium oxide (BaTiSrO3) films for uncooled infrared (IR) detector applications

Progress in materials synthesis and processing of barium titanium oxide (BaTiO3) and barium strontium titanium oxide (BaTiSrO3) films for uncooled infrared (IR) detector applications

2011
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Cover image for Bio-inspired materials research for improved sensitivity low-cost uncooled infrared (IR) detector focal-plane arrays

Bio-inspired materials research for improved sensitivity low-cost uncooled infrared (IR) detector focal-plane arrays

2010
Format: Electronic

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Cover image for Further developments in improved sensitivity, low-cost uncooled IR detector focal plane arrays

Further developments in improved sensitivity, low-cost uncooled IR detector focal plane arrays

2010
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Cover image for Design of the transmission electron microscope (TEM) sampler scriber template as developed to improve and simplify the sample preparation procedure

Design of the transmission electron microscope (TEM) sampler scriber template as developed to improve and simplify the sample preparation procedure

by Sarney, Wendy L.
2007
Format: Electronic

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Cover image for Sample preparation procedure for TEM imaging of semiconductor materials

Sample preparation procedure for TEM imaging of semiconductor materials

by Sarney, Wendy L.
2004
Format: Electronic

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$Cover image for Understanding transmission electron microscopy diffraction patterns obtained from infrared semiconductor materials$

Understanding transmission electron microscopy diffraction patterns obtained from infrared semiconductor materials

by Sarney, Wendy L.
2003
Format: Electronic

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